This book presents the select proceedings of the 7th National Conference on Advances in Metrology (AdMet 2021) organized by Maharaja Surajmal Institute of Technology, New Delhi, India. The main theme of the conference was "Sensors and Advance Materials for Measurement and Quality Improvement". The book highlights and discusses the technological developments in the areas of sensor technology, measurement, advance material for industrial application, automation and quality control. This book is aimed for all the personnel engaged in conformity assessment, quality system management, calibration and testing in all sectors of industry. The book will be a valuable reference for metrologists, scientists, engineers, academicians and students from research institutes and industrial establishments to explore the future directions in the areas of sensors, advance materials, measurement and quality improvement.

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Dr. Sanjay YadavDr. Sanjay Yadav, born in 1962, obtained his master degree in science (M.Sc.) in 1985 and Ph.D. degree in Physics in 1990. Presently, he is Chief Scientist and Head, Physico Mechanical Metrology Division of NPL leading a group of 23 scientists working on various projects. In addition, he is also holding the post of Professor, Faculty of Physical Sciences, Academy of Scientific and Innovative Research (AcSIR), HRDG, Ghaziabad teaching 'Advanced Measurement Techniques & Metrology' course, taking practical classes and supervising graduate, master and Ph.D. students since 2011.He is the recipient of research scholarships from Ministry of Home Affairs, India (1986); CSIR, India (1988); Col. G.N. Bajpayee Award of Institution of Engineers, India (1989); Commendation Certificates from Haryana Government (1991 & 1992); JICA Fellowship of JAPAN (1998), Commendation Certificates from SASO, Saudi Arabia (2003); 3 Appreciation Certificates from Director, NPL (2005); Managing Editor, MAPAN (2006-2014); nominated as Member of APMP Technical Committee of Mass Related Quantities (TCM), Australia (2013-2019); Nominated as Country Representative in APMP, China (2019); Vice President, Metrology Society of India (2020); Member, National Advisory Committee, NCERT, Delhi (2019); Members, Testing and Calibration Advisory Committee, BIS (2019, 2020 and 2021), and very recently received a prestigious International award i.e. APMP Award for Developing Economies, China (2020).He is working as the Editor-in-Chief (EIC) of the MAPAN: The Journal of Metrology Society of India; Editorial Board of the International Journal of Metrology and Quality Engineering (IJMQE), France; Associate Editor-in-Chief of BGR Publications and reviewer of several SCI journals. He has extensively visited several countries i.e. France, Japan, SASO, Saudi Arabia, Indonesia, Bhutan and Malaysia on official assignments and deputations.He has significantly contributed in the field of pressure metrology, biomedical instrumentation, ultrasonic transducers and instrumentation systems. His current research interests include research and developmental activities in physico mechanical measurements; establishment, realization, maintenance and up-gradation of national pressure and vacuum standards; dissemination of national practical pressure scale to users through apex level calibration, training and consultancy services; inter-laboratory comparisons, proficiency testing programme and key comparisons, implementation of Quality System in the laboratory as per ISO/IEC 17025 standard and Finite Element Analysis (FEA) and Monte Carlo Simulations for pressure balances.He has more than 350 research publications to his credit, published in the national and international journals of repute and conferences besides contributing several books with Springer and MSI as well as in drafting several project, scientific and technical reports, documents and policy papers. Dr. K.P. Chaudhary Dr. K.P. Chaudhary did his M.Tech in Instrumentation from NIT Kurukshetra and Ph.D. from IIT DELHI in Optical Instrumentation/Metrology. Dr. K.P. Chaudhary initially joined CSIO Chandigarh in 1980 and worked for about fifteen years in different capacities. He has designed and developed a no-contact microprocessor based Laser Scanning Micrometer. It's know how was transferred to CEL Sahibabad for commercialization and production. In addition to this, he was also responsible for the development of various opto-electronics instruments namely Digital Laser Power Meter, Laser Communication System, Optical Viscometer etc.In 1996, he joined National Physical Laboratory (NPL), Delhi as Senior Scientist. He has published more than 90 research papers in journals and International conferences. He has also registered 7 PATENTS to his credit and out of which six technologies have been transferred as consultancy projects. He has also been instrumen